Assuming that the mean of the process is in the centre of the Upper Specification Limit (USL) and Lower Specification Limit (LSL), the process has the same probability of staying inside the limit on EITHER side.



I.e. Sigma level = Lower of [(USL – Mean) OR (Mean – LSL)] / σ
The SHORTER gap divided by σ will give the sigma level of the process.
E.g. let’s consider a 6 σ process. Here 6 σ is the theoretical σ level of the process, i.e. the distance from mean to LSL and USL to mean is the same and is 6 σ. The mean is assumed to be in the centre of the specification limits.
Let’s say that the actual mean of the process, when measured, appears to have shifted 1.5 σ to one side.
Now, the new Sigma level of the process is,
Theoretical Sigma Level – Shift of the Mean
i.e. 6 σ – 1.5 σ = 4.5 σ
So the process is now a 4.5 σ process instead of a 6 σ process and the defect level is 3.4 ppm.

There is a notion that the 6 σ process yields a defect rate of 3.4 ppm. This is not entirely true as a real 6 σ process yields a defect rate of 0.002 ppm.
The 3.4 ppm concept came from a Motorola process where it was decided that a process will be called “6 σ Process” if
- The (USL – LSL) / 2 σ = 6 i.e. Theoretical sigma level = 6, and
- The Mean has shifted by 1.5 σ, yielding an actual sigma value of 4.5 and corresponding defect rate of 3.4 ppm.